The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 18, 2024
Filed:
Oct. 18, 2021
Applicant:
Jeol Ltd., Tokyo, JP;
Inventor:
Takaya Satoh, Tokyo, JP;
Assignee:
JEOL Ltd., Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01J 49/00 (2006.01);
U.S. Cl.
CPC ...
H01J 49/0009 (2013.01); H01J 49/0031 (2013.01); H01J 49/0036 (2013.01);
Abstract
A first peak list is generated based on a mass spectrum of a first polymer sample, and a second peak list is generated based on a mass spectrum of a second polymer sample. Based on the first peak list and the second peak list, a numerical value array (a differential value array, a ratio array) showing a difference between the peak lists is calculated. Based on the numerical value array and a correlated m/z array corresponding to the numerical value array, a KMD plot and an RKM plot are generated as a difference plot.