The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 18, 2024
Filed:
Mar. 04, 2022
Applicant:
Advantest Corporation, Tokyo, JP;
Inventors:
Hajime Sugimura, Saitama, JP;
Yuji Sakai, Tokyo, JP;
Assignee:
ADVANTEST CORPORATION, Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 3/00 (2006.01); G01R 31/00 (2006.01); G01R 31/26 (2020.01); G01R 31/28 (2006.01); G01R 35/00 (2006.01); G06Q 10/20 (2023.01);
U.S. Cl.
CPC ...
G06Q 10/20 (2013.01); G01R 3/00 (2013.01); G01R 31/001 (2013.01); G01R 31/26 (2013.01); G01R 31/2601 (2013.01); G01R 31/28 (2013.01); G01R 31/2886 (2013.01); G01R 31/2893 (2013.01); G01R 35/00 (2013.01);
Abstract
There is provided a maintenance apparatus including: an acquisition unit configured to acquire a plurality of test results, for each of a plurality of jigs, in a case where a plurality of devices under measurement, which are different from each other, are sequentially tested via the plurality of jigs; a calculation unit configured to calculate a variation in test results, for each jig, by using the plurality of test results; and a determination unit configured to determine maintenance timing of the jig based on the variation in the test results.