The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 11, 2024
Filed:
Aug. 25, 2021
Applicant:
Synopsys, Inc., Mountain View, CA (US);
Inventors:
Leslie K. Hwang, Chandler, AZ (US);
Srinivasa R. Arikati, San Jose, CA (US);
Assignee:
Synopsys, Inc., Sunnyvale, CA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 30/398 (2020.01); G06F 30/392 (2020.01);
U.S. Cl.
CPC ...
G06F 30/398 (2020.01); G06F 30/392 (2020.01);
Abstract
A method for identifying design rule checking (DRC) violation types within an integrated circuit (IC) chip design includes receiving an IC chip design layout, and performing a DRC process on the IC chip design layout to identify DRC violations. Further, the method includes generating clustered heatmaps from heatmaps generated from the DRC violations. The method further includes identifying a first DRC violation type and a corresponding first cell pair within the IC chip design layout by analyzing the clustered heatmaps with a diagnostic model.