The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 11, 2024

Filed:

Jan. 19, 2022
Applicant:

Micron Technology, Inc., Boise, ID (US);

Inventors:

Saira Samar Malik, Lafayette, IN (US);

Sahil Soi, Bengaluru, IN;

Taeksang Song, San Jose, CA (US);

Assignee:

Micron Technology, Inc., Boise, ID (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 3/06 (2006.01);
U.S. Cl.
CPC ...
G06F 3/0659 (2013.01); G06F 3/0604 (2013.01); G06F 3/0679 (2013.01);
Abstract

Methods, systems, and devices for quality-of-service information for a multi-memory system are described. An interface controller may receive a first command from a host device during a set of clock cycles. The first command may be received over a command bus that includes a pin, such as a command select pin configured for double data rate signaling. The interface controller may decode the first command based on a state of the command select pin during at least one clock cycle of the set of clock cycles. And the interface controller may determine quality-of-service information for a second command based on decoding the first command and on information, such as a plurality of bits, included in the first command.


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