The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 11, 2024
Filed:
Sep. 04, 2019
Carl Zeiss Microscopy Gmbh, Jena, DE;
CARL ZEISS MICROSCOPY GMBH, Jena, DE;
Abstract
A method for capturing an image of an object includes guiding a scanning beam along a scanning trajectory over the object using a scanner, with the scanning movement being periodic in a direction. The scanning movement is sampled at a first sampling frequency for detecting and capturing a current position of the scanner as position values and radiation from the object is captured as captured sampling values at a second sampling frequency. Current values of the amplitude and the phase of the scanning movement are calculated. A current amplitude, phase and/or frequency and future changes in the amplitude, phase and/or frequency over time are calculated. An image grid is set, with grid elements being assigned the sampling values based on times at which the scanning beam crosses or will cross at least one boundary of the grid elements.