The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 11, 2024
Filed:
Mar. 08, 2022
HI Llc, Los Angeles, CA (US);
Micah Ledbetter, Sunnyvale, CA (US);
Ricardo Jimenez-Martinez, Culver City, CA (US);
Geoffrey Iwata, Los Angeles, CA (US);
HI LLC, Los Angeles, CA (US);
Abstract
A magnetic field measurement system includes a light source that emits a light beam; an optical fiber to transmit the light beam; a variable optical attenuator to increase stability of an intensity of the light beam; a beam splitter to divide the light beam into an OPM light beam and a monitor light beam; a monitor detector to detect the monitor light beam and generate a monitor signal; a vapor cell with alkali metal atoms disposed therein and configured for transmission of the OPM light beam through the vapor cell; an OPM detector to detect the OPM light beam after transmission through the vapor cell and generate an OPM signal; and a group delay filter to combine the monitor signal and the OPM signal to generate a reduced noise OPM signal, where the group delay filter accounts for a phase difference between the monitor signal and the OPM signal.