The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 04, 2024

Filed:

Dec. 03, 2021
Applicant:

Sumco Corporation, Tokyo, JP;

Inventors:

Toshiaki Ono, Tokyo, JP;

Bong-Gyun Ko, Tokyo, JP;

Assignee:

SUMCO CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H10B 41/20 (2023.01); H01L 21/02 (2006.01); H10B 41/35 (2023.01);
U.S. Cl.
CPC ...
H10B 41/20 (2023.02); H10B 41/35 (2023.02); H01L 21/02164 (2013.01); H01L 21/0217 (2013.01); H01L 21/022 (2013.01); H01L 21/02211 (2013.01); H01L 21/02274 (2013.01);
Abstract

A method of reducing warp imparted to a silicon wafer having a (110) plane orientation and a <111> notch orientation by anisotropic film stress of a multilayer film that is to be formed on a surface of the silicon wafer, that includes forming the multilayer film on a surface of the silicon wafer in an orientation so that a direction in which the warp of the wafer will be greatest coincides with a direction in which Young's modulus of a crystal orientation of the silicon wafer is greatest. Also, a method of reducing warp imparted to a silicon wafer having a (111) plane orientation by isotropic film stress of a multilayer film to be formed on a surface of the silicon wafer, that includes, prior to forming the multilayer film, causing the silicon wafer to have an oxygen concentration of 8.0×10atoms/cmor more (ASTM F-121, 1979).


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