The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 04, 2024
Filed:
Nov. 15, 2021
Applicant:
Hon Hai Precision Industry Co., Ltd., New Taipei, TW;
Inventors:
Assignee:
HON HAI PRECISION INDUSTRY CO., LTD., New Taipei, TW;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/00 (2017.01); G06T 1/00 (2006.01); G06T 5/50 (2006.01);
U.S. Cl.
CPC ...
G06T 7/001 (2013.01); G06T 1/0007 (2013.01); G06T 5/50 (2013.01); G06T 2207/30148 (2013.01);
Abstract
A defect detection method based on an image of products and an electronic device can accurately determine the error threshold by determining the reconstruction error generated during image reconstruction and by determining the estimated probability generated by the Gaussian mixture model. The test error can then be compared with the error, since the test error and the error threshold are compared numerically, the existence of subtle defects are revealed in the product image, thereby improving the accuracy of defect detection.