The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 04, 2024
Filed:
Nov. 01, 2021
Carl Zeiss Microscopy Gmbh, Jena, DE;
Tiemo Anhut, Jena, DE;
Daniel Schwedt, Jena, DE;
CARL ZEISS MICROSCOPY GMBH, Jena, DE;
Abstract
A device includes a detection path, along which detection radiation is guided, and a means for splitting the detection radiation between first and second detection paths. A detector has detector elements in each detection path. A microlens array is disposed upstream of each detector in a pupil. The first and second detectors have a substantially identical spatial resolution. The detector elements of the first detector are arranged line by line in a first line direction, while the detector elements of the second detector are arranged line by line in a second line direction. The first and second detectors are arranged relative to the image to be captured such that the first and second line directions are inclined relative to one another. A readout unit for reading out the image data of the detectors is configured for selectively reading those detector elements arranged line by line which form an image line.