The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 04, 2024

Filed:

Dec. 16, 2021
Applicant:

Howard Hughes Medical Institute, Ashburn, VA (US);

Inventors:

Robert Eric Betzig, Berkeley, CA (US);

Tsung-Li Liu, San Diego, CA (US);

Daniel E. Milkie, Ashburn, VA (US);

Kai Wang, Ashburn, VA (US);

Wesley Legant, Fairfax, VA (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 21/36 (2006.01); G01N 21/64 (2006.01); G02B 21/00 (2006.01); G02B 21/06 (2006.01); G02B 26/06 (2006.01); G02B 27/00 (2006.01); G02B 27/58 (2006.01);
U.S. Cl.
CPC ...
G02B 21/361 (2013.01); G01N 21/64 (2013.01); G01N 21/6428 (2013.01); G01N 21/6458 (2013.01); G02B 21/0032 (2013.01); G02B 21/0072 (2013.01); G02B 21/0076 (2013.01); G02B 21/06 (2013.01); G02B 21/367 (2013.01); G02B 26/06 (2013.01); G02B 27/0025 (2013.01); G02B 27/58 (2013.01); G02B 2207/114 (2013.01);
Abstract

A microscope directs light through an excitation objective to generate a lattice light sheet (LLS) within a sample. A detection objective collects signal light from the sample in response to the LLS and images the collected light onto a detector. Second and third light beams are imaged onto focal planes of the excitation objective and detection objective, respectively. One or more wavefront detectors determine wavefronts of light emitted from the sample and through the excitation objective in response to the imaged second light beam and emitted from the sample through the detection objective in response to the imaged third light beam. A wavefront of the first light beam is modified to reduce a sample-induced aberration of the LLS within the sample, and a wavefront of the signal light emitted from the sample is modified to reduce a sample-induced aberration of the signal light at the detector.


Find Patent Forward Citations

Loading…