The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 28, 2024
Filed:
Apr. 24, 2020
Showa Denko K.k., Tokyo, JP;
Yoshishige Okuno, Tokyo, JP;
Eriko Takeda, Tokyo, JP;
Junichi Shibuya, Tokyo, JP;
Yuki Nakao, Tokyo, JP;
Kenji Ogawa, Tokyo, JP;
RESONAC CORPORATION, Tokyo, JP;
Abstract
To improve a determination accuracy when determining each particle contained in an image of an object. An image analysis apparatus according to an embodiment of the present invention includes: a shape determination unit configured to determine a shape of a particle included in a particle image that is extracted from an image of an object, so that an OK particle image which is a particle image of an OK particle that satisfies a predetermined standard for shape and a provisional NG particle image which is a particle image of a provisional NG particle that does not satisfy the predetermined standard, are obtained; a pseudo image generation unit configured to generate a pseudo image; and a similarity determination unit configured to determine whether the provisional NG image and the pseudo image are similar.