The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 21, 2024
Filed:
Mar. 16, 2022
Carl Zeiss Microscopy Gmbh, Jena, DE;
SD Optics, Inc., Seoul, KR;
Stereo Display, Inc., Anaheim, CA (US);
Alexander Gaiduk, Jena, DE;
Ilja Karanin, Munich, DE;
Pavlos Iliopoulos, Weimar, DE;
Jin Young Sohn, Fullerton, CA (US);
Gyoungil Cho, Fullerton, CA (US);
Cheong Soo Seo, Brea, CA (US);
Carl Zeiss Microscopy GmbH, Jena, DE;
SD Optics, Inc., Seoul, KR;
Stereo Display, Inc., Anaheim, CA (US);
Abstract
The present invention concerns a method for producing a microscopic image with an extended depth of field by means of a microscope. The microscope comprises an images sensor that comprises pixels that are arranged as a matrix that is formed by lines. In a step of the method, a plurality of microscopic frames of a specimen is acquired while a focus position (z) is changed. The microscopic frames are acquired line by line. The focus position (z) is changed over a course of acquiring individuals of the microscopic frames. In a further step, parts of individuals of the acquired lines are identified. These parts sharply image the specimen. The identified parts of the lines are composed in order to form a microscopic image of the specimen with an extended depth of field. Furthermore, the present invention concerns a microscope.