The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 14, 2024

Filed:

Jul. 26, 2022
Applicant:

Micron Technology, Inc., Boise, ID (US);

Inventors:

Subhasis Sasmal, Hyderabad, IN;

Dong Pan, Boise, ID (US);

Assignee:

Micron Technology, Inc., Boise, ID (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C 29/50 (2006.01); G01R 19/165 (2006.01); G11C 29/12 (2006.01);
U.S. Cl.
CPC ...
G11C 29/50004 (2013.01); G01R 19/16528 (2013.01); G01R 19/16533 (2013.01); G11C 29/12005 (2013.01); G11C 2029/5004 (2013.01);
Abstract

An electronic device, such as a memory device, may include various circuit components. The electronic device may also include one or more voltage testing circuits to determine whether signals of one or more of the circuit components are within acceptable voltage ranges of the respective circuit components. Systems and methods are described to improve correct voltage measurement of the received signals by a voltage testing circuit. In particular, multiple supply voltage levels are provided to different components of the voltage testing circuit to provide a sufficient headroom voltage gap between received signals and the supply voltages. For example, some active circuits (e.g., operational amplifiers) of the voltage testing circuit may receive a higher supply voltage of the electronic device compared to one or more other circuits of the voltage testing circuit.


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