The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 14, 2024
Filed:
Jan. 27, 2022
Hon Hai Precision Industry Co., Ltd., New Taipei, TW;
HON HAI PRECISION INDUSTRY CO., LTD., New Taipei, TW;
Abstract
An image defect detection method used in an electronic device, calculates a Kullback-Leible divergence between a first probability distribution and a second probability distribution, and thereby obtains a total loss. Images of samples for testing are input into an autoencoder to calculate a second latent features of the testing sample images and the second reconstructed images. Second reconstruction errors are calculated by a preset error function, as is a third probability distribution of the second latent features, and a total error is calculated according to the third probability distribution and the second reconstruction errors. When the total error is greater than or equal to the threshold, determining that the images of samples for testing reveal defects, and when the total error is less than the threshold, determining that the images of samples for testing reveal no defects.