The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 14, 2024

Filed:

Jan. 28, 2022
Applicant:

Micron Technology, Inc., Boise, ID (US);

Inventors:

Chunhua Yao, Boise, ID (US);

Gangotree Chakma, San Jose, CA (US);

Bhagyashree Bokade, Boise, ID (US);

Assignee:

Micron Technology, Inc., Boise, ID (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
F24F 11/64 (2018.01); F24F 11/47 (2018.01); G06N 3/08 (2023.01); F24F 110/12 (2018.01); F24F 120/14 (2018.01); F24F 140/60 (2018.01);
U.S. Cl.
CPC ...
F24F 11/64 (2018.01); F24F 11/47 (2018.01); G06N 3/08 (2013.01); F24F 2110/12 (2018.01); F24F 2120/14 (2018.01); F24F 2140/60 (2018.01);
Abstract

Methods, systems, and devices for an interactive environmental control system are described. In some examples, operating temperatures for individual zones of an environment may be determined based on inputs received from occupants of the respective zones. For example, a building may be separated into zones, and environmental conditions at each zone may be monitored and adjusted independently. Each occupant of a zone may update their environmental preference and the system may utilize the user inputs to set and adjust an operating temperature for the respective zone based on the occupants' preferences. In some examples, the system may implement machine learning techniques to predict and set operating conditions for the zones based on inputs, such as a history of inputs, from building occupants (e.g., from occupants of a respective zone).


Find Patent Forward Citations

Loading…