The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 07, 2024

Filed:

Oct. 12, 2020
Applicant:

Carl Zeiss Microscopy Gmbh, Jena, DE;

Inventors:

Daniel Schwedt, Jena, DE;

Tiemo Anhut, Jena, DE;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 21/36 (2006.01); G01J 1/32 (2006.01); G01J 1/44 (2006.01);
U.S. Cl.
CPC ...
G02B 21/367 (2013.01); G01J 1/32 (2013.01); G01J 1/44 (2013.01); G01J 2001/442 (2013.01);
Abstract

A light microscope and a method for capturing images with a light microscope includes guiding illumination light to a sample; guiding detection light from the sample to a plurality of photon-counting sensor elements, which each successively capture a plurality of photon counts; forming a plurality of photon count distributions to be analyzed and at least one reference photon count distribution from the photon counts; calculating a similarity between each photon count distribution to be analyzed and the reference photon count distribution; and identifying sensor elements as overdriven as a function of the calculated similarity of the corresponding photon count distribution(s) to be analyzed.


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