The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 07, 2024

Filed:

Sep. 14, 2018
Applicant:

Illumina, Inc., San Diego, CA (US);

Inventors:

Jeffrey G. Mandell, San Diego, CA (US);

Kevin L. Gunderson, San Diego, CA (US);

Michael Gregory Keehan, San Diego, CA (US);

Erin Christine Garcia, San Diego, CA (US);

Assignee:

ILLUMINA, INC., San Diego, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
C12Q 1/6869 (2018.01); B01L 3/00 (2006.01); G01N 27/447 (2006.01);
U.S. Cl.
CPC ...
C12Q 1/6869 (2013.01); B01L 3/502707 (2013.01); B01L 3/502715 (2013.01); G01N 27/44791 (2013.01);
Abstract

The current document discusses electromechanical sequence detectors that transduce changes in the shape of a shape-change sensor component into an electrical signal from which one or more derived values are generated. In a disclosed implementation, the sequence-detection system comprises a mechanical-change sensor that changes shape when specifically interacting with entities within a target, a shape-to-signal-transduction component that transduces changes in the shape of the mechanical-change sensor into an electrical signal, an analysis subsystem that determines the types of entities within the target using the electrical signal, and a control subsystem that continuously monitors operational characteristics of the sequence-detection system and adjusts sequence-detection system operational parameters.


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