The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 30, 2024

Filed:

Nov. 23, 2021
Applicant:

Fei Company, Hillsboro, OR (US);

Inventors:

Pleun Dona, Veldhoven, NL;

Casper Smit, Eindhoven, NL;

Rients Jan de Groot, Heeze, NL;

Assignee:

FEI Company, Hillsboro, OR (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01J 37/16 (2006.01); B33Y 80/00 (2015.01); H01J 37/18 (2006.01);
U.S. Cl.
CPC ...
H01J 37/165 (2013.01); H01J 37/18 (2013.01); B33Y 80/00 (2014.12);
Abstract

Methods and apparatus are disclosed for providing an X-ray shield within an ultra-high vacuum enclosure. A shell is fabricated, leak-tested, filled with an X-ray shielding material, and sealed. An elongated twisted X-ray shield can be deployed within a pump-out channel of an electron microscope or similar equipment. The shield can incorporate lead within a stainless steel shell, with optional low-Z cladding outside the shell. Further variations are disclosed.


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