The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 30, 2024
Filed:
Oct. 27, 2022
Tencent Technology (Shenzhen) Company Limited, Guangdong, CN;
Xiu Gu, Guangdong, CN;
Sainan Huai, Guangdong, CN;
Shuoming An, Guangdong, CN;
Zhenxing Zhang, Guangdong, CN;
Yu Zhou, Guangdong, CN;
Xiong Xu, Guangdong, CN;
Shengyu Zhang, Guangdong, CN;
TENCENT TECHNOLOGY (SHENZHEN) COMPANY LIMITED, Guangdong, CN;
Abstract
A parity checking method and apparatus for a qubit, a superconducting quantum chip, an electronic device, and a storage medium are provided. The method includes: configuring a measurement system for a qubit excited state measurement environment, the measurement system including: a first data qubit, a second data qubit, and an auxiliary qubit; determining a first operational frequency parameter of the first data qubit; determining a second operational frequency parameter of the second data qubit; determining a third operational frequency parameter of the auxiliary qubit; determining a logic gate matching the qubit excited state measurement environment based on the first operational frequency parameter, the second operational frequency parameter, and the third operational frequency parameter; and checking parity of a qubit in the qubit excited state measurement environment according to the logic gate.