The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 30, 2024
Filed:
Nov. 09, 2020
Lattice Semiconductor Corporation, Hillsboro, OR (US);
Fulong Zhang, Cupertino, CA (US);
Srirama Chandra, Portland, OR (US);
Sreepada Hegade, San Jose, CA (US);
Joel Coplen, Portland, OR (US);
Wei Han, Portland, OR (US);
Yu Sun, Shanghai, CN;
Lattice Semiconductor Corporation, Hillsboro, OR (US);
Abstract
Systems and methods for failure characterization of secure programmable logic devices (PLDs) are disclosed. An example system includes a secure PLD including programmable logic blocks (PLBs) arranged in PLD fabric of the secure PLD, and a configuration engine configured to program the PLD fabric according to a configuration image stored in non-volatile memory (NVM) of the secure PLD and/or coupled through a configuration input/output (I/O) of the secure PLD. The secure PLD is configured to receive a failure characterization (FC) command from the PLD fabric or an external system coupled to the secure PLD through the configuration I/O, and to execute the FC command to, at least in part, erase and/or nullify portions of the NVM. The secure PLD may also be configured to boot a debug configuration for the PLD fabric that identifies and/or characterizes operational failures of the secure PLD.