The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 30, 2024

Filed:

Feb. 11, 2022
Applicant:

Micron Technology, Inc., Boise, ID (US);

Inventors:

Alberto Sassara, Naples, IT;

Basso Francesco, Portici, IT;

Crescenzo Attanasio, Acerra, IT;

Massimo Iaculo, San Marco Evangelista, IT;

Assignee:

Micron Technology, Inc., Boise, ID (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/07 (2006.01); G06F 13/16 (2006.01);
U.S. Cl.
CPC ...
G06F 11/0778 (2013.01); G06F 11/0727 (2013.01); G06F 11/0751 (2013.01); G06F 13/1668 (2013.01);
Abstract

In various embodiments, techniques can be provided to address debug efficiency for failures found on an operational system. The techniques can utilize a real-time trigger to notify a memory device to dump an error log to timely capture all needed information. In response to detecting one or more error conditions associated with the memory device, a system that interfaces with the memory device can generate a trigger signal to the memory device. In response to identifying the trigger signal, the memory device can dump an error log of the memory device to a memory component in the memory device. The error log can later be retrieved from the memory component for failure analysis.


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