The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 30, 2024

Filed:

May. 09, 2023
Applicant:

Ceremorphic, Inc., San Jose, CA (US);

Inventors:

Robert F. Wiser, Santa Cruz, CA (US);

Shakti Singh, Bijnor Uttar Pradesh, IN;

Neelam Surana, Gujarat, IN;

Assignee:

Ceremorphic, Inc., San Jose, CA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/3185 (2006.01); G01R 31/317 (2006.01); G01R 31/319 (2006.01); H03K 3/037 (2006.01); H03K 3/3562 (2006.01);
U.S. Cl.
CPC ...
G01R 31/318541 (2013.01); G01R 31/31723 (2013.01); G01R 31/318572 (2013.01); G01R 31/31924 (2013.01); H03K 3/0372 (2013.01); H03K 3/35625 (2013.01); G01R 31/318583 (2013.01);
Abstract

A scan chain architecture with lowered power consumption comprises a multiplexer selecting between a functional input and a test input. The output of the multiplexer is coupled to a low threshold voltage latch and, in test mode, to a standard threshold voltage latch. The low threshold voltage latch and standard threshold voltage latch are configured to store data when a clock input falls, using a master latch functional clock M_F_CLK, master latch test clock M_T_CLK, slave latch functional clock S_F_CLK, and slave latch test clock S_T_CLK. The slave latch has lower power consumption than the master latch.


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