The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 23, 2024

Filed:

Jan. 26, 2022
Applicant:

Infineon Technologies Ag, Neubiberg, DE;

Inventors:

Gernot Langguth, Oberhaching, DE;

Anton Boehm, Munich, DE;

Christian Cornelius Russ, Diedorf, DE;

Mirko Scholz, Ottobrunn, DE;

Assignee:

Infineon Technologies AG, Neubiberg, DE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 29/74 (2006.01); H01L 27/02 (2006.01); H01L 29/06 (2006.01); H02H 9/04 (2006.01);
U.S. Cl.
CPC ...
H01L 29/7436 (2013.01); H01L 27/0259 (2013.01); H01L 29/0692 (2013.01); H02H 9/046 (2013.01); H01L 27/0285 (2013.01); H01L 27/0292 (2013.01); H01L 29/7408 (2013.01);
Abstract

In accordance with an embodiment, a semiconductor device includes: an n-doped region disposed over an insulating layer; a p-doped region disposed over the insulating layer adjacent to the n-doped region, where an interface between the n-doped region and the p-doped region form a first diode junction; a plurality of segmented p-type anode regions disposed over the insulating layer, each of the plurality of segmented p-type anode regions being surrounded by the n-doped region, where a doping concentration of the plurality of segmented p-type anode regions is greater than a doping concentration of the p-doped region; and a plurality of segmented n-type cathode regions disposed over the insulating layer. Each of the plurality of segmented n-type cathode regions are surrounded by the p-doped region, where a doping concentration of the plurality of segmented n-type cathode regions is greater than a doping concentration of the n-doped region.


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