The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 23, 2024
Filed:
Jan. 17, 2020
Applicant:
Hewlett-packard Development Company, L.p., Spring, TX (US);
Inventors:
Juan Carlos Catana Salazar, San Diego, CA (US);
Jun Zeng, Palo Alto, CA (US);
He Luan, Palo Alto, CA (US);
Assignee:
Hewlett-Packard Development Company, L.P., Spring, TX (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 19/20 (2011.01); B33Y 50/00 (2015.01); G06F 30/27 (2020.01);
U.S. Cl.
CPC ...
G06T 19/20 (2013.01); B33Y 50/00 (2014.12); G06F 30/27 (2020.01); G06T 2219/2004 (2013.01); G06T 2219/2021 (2013.01);
Abstract
Examples of methods for object deformation determination are described herein. In some examples, a method includes aligning a first bounding box of a three-dimensional (3D) object model with a second bounding box of a scan. In some examples, the method includes determining a deformation between the 3D object model and the scan based on the alignment.