The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 23, 2024
Filed:
Nov. 07, 2019
Carl Zeiss Microscopy Gmbh, Jena, DE;
Tiemo Anhut, Jena, DE;
Daniel Schwedt, Jena, DE;
Carl Zeiss Microscopy GmbH, Jena, DE;
Abstract
A light microscope having a scanner for scanning a sample with illuminating light and a light detector for measuring sample light. A microlens array having a plurality of microlenses is arranged in front of the light detector in the region of a pupil plane. The light detector respectively has a plurality of detector elements behind each microlens and has a complete readout frequency of at least 100 kHz. By means of the detector elements arranged behind the respective microlens, a wavefront datum regarding the sample light is determined. Moreover, a sample point signal is computed from signals of the detector elements. Illuminating light is successively deflected onto different sample points with the scanner and corresponding sample point signals are captured, wherein, for at least some of the different sample points, a corresponding wavefront datum is also determined. The determined wavefront data can be taken into account in a calculation of a sample image from the plurality of sample point signals.