The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 23, 2024

Filed:

Aug. 25, 2021
Applicant:

Wonik Ips Co., Ltd., Pyeongtaek-si, KR;

Inventors:

Kyung Park, Seoul, KR;

Hyeon Beom Gwon, Seoul, KR;

Dae Seong Lee, Dongducheon-si, KR;

Assignee:

WONIK IPS CO., LTD, Pyeongtaek-si, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
C23C 16/34 (2006.01); C23C 16/455 (2006.01); H01L 21/02 (2006.01);
U.S. Cl.
CPC ...
C23C 16/45557 (2013.01); C23C 16/34 (2013.01); C23C 16/45527 (2013.01); H01L 21/02186 (2013.01); H01L 21/0228 (2013.01);
Abstract

The present invention disclosed herein relates to a substrate processing method, and more particularly, to: a substrate processing method in which a flow rate of a process gas in a depressurizing operation is regulated in a pressure changing process for improving properties of a thin film; a substrate processing apparatus using the substrate processing method; and a semiconductor manufacturing method.


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