The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 16, 2024

Filed:

Dec. 23, 2019
Applicant:

Intel Corporation, Santa Clara, CA (US);

Inventors:

Kameran Azadet, San Ramon, CA (US);

Martin Clara, Santa Clara, CA (US);

Daniel Gruber, St. Andrae, AT;

Albert Molina, Novelda, ES;

Hundo Shin, Santa Clara, CA (US);

Assignee:

Intel Corporation, Santa Clara, CA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H03M 1/10 (2006.01); G01R 31/28 (2006.01); G01R 31/3187 (2006.01); G01R 31/26 (2020.01); H03M 1/08 (2006.01); H03M 1/46 (2006.01);
U.S. Cl.
CPC ...
H03M 1/1071 (2013.01); G01R 31/2856 (2013.01); G01R 31/3187 (2013.01); G01R 31/26 (2013.01); H03M 1/0854 (2013.01); H03M 1/462 (2013.01);
Abstract

A semiconductor chip providing on-chip self-testing of an Analog-to-Digital Converter, ADC, implemented in the semiconductor chip is provided. The semiconductor chip comprises the ADC and a Digital-to-Analog Converter, DAC, configured to generate and supply a radio frequency test signal to the ADC via a supply path. The ADC is configured to generate digital output data based on the radio frequency test signal. The semiconductor chip further comprises a reference data generation circuit configured to generate digital reference data. Additionally, the semiconductor chip comprises a comparator circuit configured to compare the digital output data to the digital reference in order to determine error data.


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