The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 16, 2024

Filed:

Oct. 12, 2021
Applicant:

T.o.s Co., Ltd., Osan-si, KR;

Inventors:

Yong Kyu Kim, Suwon-si, KR;

Bum Ho Choi, Goyang-si, KR;

Yong Sik Kim, Suwon-si, KR;

Kwang Ki Kang, Osan-si, KR;

Hong Jong Jung, Osan-si, KR;

Seok Ho Lee, Pyeongtaek-si, KR;

Seung Soo Lee, Suwon-si, KR;

Assignee:

T.O.S Co., Ltd., Gyeonggi-do, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01J 37/32 (2006.01); H05H 1/00 (2006.01);
U.S. Cl.
CPC ...
H01J 37/32944 (2013.01); H01J 37/3211 (2013.01); H05H 1/0081 (2013.01);
Abstract

Disclosed herein is a multi-channel device for detecting plasma at an ultra-fast speed, including: a first antenna module connected to a first output terminal in contact with a substrate on a chuck of a process chamber and extending to ground, and receiving a first leakage current leaking through the substrate to increase reception sensitivity of the leakage current; a first current detection module detecting the first leakage current; a current measurement module receiving the first leakage current output from the first current detection module, and extracting the received first leakage current for each predetermined period to generate a first leakage current measurement information; and a control module comparing the first leakage current measurement information with a reference value to generate first arcing occurrence information.


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