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The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 11961210 B1

PDFFull Text
Date of Patent:
Apr. 16, 2024

Filed:

Feb. 27, 2023

System, method and apparatus for macroscopic inspection of reflective specimens

Applicant:

Nanotronics Imaging, Inc., Cuyahoga Falls, OH (US);

Inventors:

Jonathan Lee, Brooklyn, NY (US);

Damas Limoge, Brooklyn, NY (US);

Matthew C. Putman, Brooklyn, NY (US);

John B. Putman, Celebration, FL (US);

Michael Moskie, San Jose, CA (US);

Assignee:

Nanotronics Imaging, Inc., Cuyahoga Falls, OH (US);

Attorney:

DLA PIPER LLP (US)

Primary Examiner:

Allen C Wong

Int. Cl.
CPC ...
G06T 5/00 (2006.01); G06T 5/50 (2006.01); G06T 7/00 (2017.01); H04N 23/56 (2023.01); H04N 23/695 (2023.01); H04N 23/90 (2023.01);
U.S. Cl.
CPC ...
G06T 5/002 (2013.01); G06T 5/50 (2013.01); G06T 7/0002 (2013.01); H04N 23/56 (2023.01); H04N 23/695 (2023.01); H04N 23/90 (2023.01); G06T 2207/10056 (2013.01); G06T 2207/20221 (2013.01); G06T 2207/30168 (2013.01);
Abstract

An inspection apparatus includes a specimen stage configured to retain a specimen, at least three imaging devices arranged in a triangular array positioned above the specimen stage, each of the at least three imaging devices configured to capture an image of the specimen, one or more sets of lights positioned between the specimen stage and the at least three imaging devices, and a control system in communication with the at least three imaging devices.

Find Patent Forward Citations

Lee, Jonathan. (2024). System, method and apparatus for macroscopic inspection of reflective specimens (U.S. Patent No. 11961210). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11961210

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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