The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 16, 2024
Filed:
Feb. 16, 2021
Carl Zeiss Microscopy Gmbh, Jena, DE;
Frank Klemm, Jena, DE;
Thomas Egloff, Jena, DE;
Carl Zeiss Microscopy GmbH, Jena, DE;
Abstract
A method for capturing a relative alignment of a surface (), extending substantially in one plane, of an object (), in which a focus (f) of a light beam is guided along a scanning path (). Components of the light beam that are reflected by the surface () are captured. The scanning path () extends substantially parallel to an x-y-plane that extends orthogonally to an optical axis (oA) of a detection objective (). A relative position and alignment of the surface () are ascertained on the basis of the reflected components. A normal (N) of the surface () and the relative alignment thereof are virtually ascertained and/or the focus (F) is moved in the direction of the optical axis (oA) during the scanning of the scanning path () such that an axial scan trajectory or an axial scanning path () are brought about.