The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 16, 2024

Filed:

Apr. 13, 2021
Applicant:

Semiconductor Energy Laboratory Co., Ltd., Atsugi, JP;

Inventors:

Shunpei Yamazaki, Tokyo, JP;

Tetsunori Maruyama, Kanagawa, JP;

Yuki Imoto, Kanagawa, JP;

Hitomi Sato, Kanagawa, JP;

Masahiro Watanabe, Tochigi, JP;

Mitsuo Mashiyama, Tochigi, JP;

Kenichi Okazaki, Tochigi, JP;

Motoki Nakashima, Kanagawa, JP;

Takashi Shimazu, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
C23C 14/34 (2006.01); B28B 11/24 (2006.01); C04B 35/453 (2006.01); C04B 35/64 (2006.01); C23C 14/08 (2006.01); H01L 21/02 (2006.01); H01L 29/24 (2006.01); H01L 29/66 (2006.01); H01L 29/786 (2006.01);
U.S. Cl.
CPC ...
C23C 14/3414 (2013.01); B28B 11/243 (2013.01); C04B 35/453 (2013.01); C04B 35/64 (2013.01); C23C 14/08 (2013.01); C23C 14/086 (2013.01); C23C 14/345 (2013.01); H01L 21/02565 (2013.01); H01L 21/02631 (2013.01); H01L 29/24 (2013.01); H01L 29/66969 (2013.01); H01L 29/7869 (2013.01); C04B 2235/3284 (2013.01); C04B 2235/3286 (2013.01); C04B 2235/76 (2013.01);
Abstract

There have been cases where transistors formed using oxide semiconductors are inferior in reliability to transistors formed using amorphous silicon. Thus, in the present invention, a semiconductor device including a highly reliable transistor formed using an oxide semiconductor is manufactured. An oxide semiconductor film is deposited by a sputtering method, using a sputtering target including an oxide semiconductor having crystallinity, and in which the direction of the c-axis of a crystal is parallel to a normal vector of the top surface of the oxide semiconductor. The target is formed by mixing raw materials so that its composition ratio can obtain a crystal structure.


Find Patent Forward Citations

Loading…