The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 09, 2024

Filed:

Jul. 19, 2019
Applicant:

Samsung Electronics Co., Ltd., Suwon-si, KR;

Inventor:

Yun Heub Song, Seoul, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C 16/04 (2006.01); H01L 23/528 (2006.01); H10B 41/10 (2023.01); H10B 41/27 (2023.01); H10B 41/30 (2023.01); H10B 43/10 (2023.01); H10B 43/27 (2023.01); H10B 43/30 (2023.01);
U.S. Cl.
CPC ...
G11C 16/0483 (2013.01); H01L 23/5283 (2013.01); H10B 41/10 (2023.02); H10B 41/27 (2023.02); H10B 41/30 (2023.02); H10B 43/10 (2023.02); H10B 43/27 (2023.02); H10B 43/30 (2023.02);
Abstract

A three-dimensional flash memory including an intermediate wiring layer and a method of manufacturing the same are disclosed. According to an embodiment, a method of manufacturing a three-dimensional flash memory by using a back end process includes: forming a lower string in a first block, the first block including a sacrificial layer and an insulation layer which are formed to extend in a first direction and are alternately stacked; generating an inter-string insulation layer on the first block that has the lower string formed therein; etching at least a portion of the inter-string insulation layer to form at least one sacrificial film in a space where the at least a portion is etched; generating a second block on the inter-string insulation layer, where the at least one sacrificial film is formed, the second block including a sacrificial layer and an insulation layer which are formed to extend in the first direction and are alternately stacked; forming an upper string in the second block; etching the sacrificial layer included in the first block, the at least one sacrificial film, and the sacrificial layer included in the second block; and forming an electrode layer, which is to be used as at least one intermediate wiring layer, in a space where the at least one sacrificial film is etched, and an electrode layer, which is to be used as a word line, in a space where the sacrificial layer included in the first block is etched and a space where the sacrificial layer included in the second block is etched.


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