The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 02, 2024

Filed:

Dec. 09, 2019
Applicant:

Iucf-hyu (Industry-university Cooperation Foundation Hanyang University), Seoul, KR;

Inventors:

Myung Mo Sung, Seoul, KR;

Lynn Lee, Gyeonggi-do, KR;

Jin Won Jung, Seoul, KR;

Jong Chan Kim, Paju-si, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 21/02 (2006.01); C23C 16/40 (2006.01); C23C 16/455 (2006.01); C30B 25/02 (2006.01); C30B 29/16 (2006.01); H01L 21/30 (2006.01); H01L 29/04 (2006.01); H01L 29/20 (2006.01); H01L 29/22 (2006.01); H01L 29/786 (2006.01); H01L 33/12 (2010.01); H01L 33/16 (2010.01); H01L 33/28 (2010.01); H01L 33/32 (2010.01);
U.S. Cl.
CPC ...
H01L 21/0262 (2013.01); C23C 16/407 (2013.01); C23C 16/45525 (2013.01); C30B 25/02 (2013.01); C30B 29/16 (2013.01); H01L 21/0242 (2013.01); H01L 21/02433 (2013.01); H01L 21/0254 (2013.01); H01L 21/02554 (2013.01); H01L 21/02609 (2013.01); H01L 21/30 (2013.01); H01L 29/045 (2013.01); H01L 29/2003 (2013.01); H01L 29/22 (2013.01); H01L 29/78696 (2013.01); H01L 33/12 (2013.01); H01L 33/16 (2013.01); H01L 33/28 (2013.01); H01L 33/32 (2013.01);
Abstract

Provided are a method for manufacturing a single-crystal semiconductor layer. The method of manufacturing the single crystalline semiconductor layer includes performing a unit cycle multiple times, wherein the unit cycle includes a metal precursor pressurized dosing operation in which a metal precursor is adsorbed on a surface of a single crystalline substrate by supplying the metal precursor onto the single crystalline substrate while an outlet of a chamber in which the single crystalline substrate is loaded is closed such that a reaction pressure in the chamber is increased; a metal precursor purge operation; a reactive gas supplying operation in which a reactive gas is supplied into the chamber to cause a reaction of the reactive gas with the metal precursor adsorbed on the single crystalline substrate after the metal precursor purge operation; and a reactive gas purge operation.


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