The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 02, 2024
Filed:
Nov. 06, 2021
Applicant:
Changxin Memory Technologies, Inc., Anhui, CN;
Inventor:
Liang Zhang, Shanghai, CN;
Assignee:
CHANGXIN MEMORY TECHNOLOGIES, INC., Hefei, CN;
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G11C 29/10 (2006.01); G01R 29/02 (2006.01); G11C 7/10 (2006.01); G11C 29/02 (2006.01); G11C 29/12 (2006.01); G11C 29/36 (2006.01); G11C 29/46 (2006.01);
U.S. Cl.
CPC ...
G11C 29/10 (2013.01); G01R 29/023 (2013.01); G11C 7/106 (2013.01); G11C 7/1087 (2013.01); G11C 29/023 (2013.01); G11C 29/12015 (2013.01); G11C 29/36 (2013.01); G11C 29/46 (2013.01); G11C 2029/3602 (2013.01);
Abstract
A testing circuit includes: a first sampling module configured to receive a to-be-tested pulse signal, and generate a first sampled signal according to the pulse signal; and a second sampling module configured to receive the pulse signal, and generate a second sampled signal according to the pulse signal. The second sampled signal and the first sampled signal have a phase difference, the phase difference being equal to a pulse width of the pulse signal.