The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 02, 2024
Filed:
Oct. 03, 2022
Applicant:
Micron Technology, Inc., Boise, ID (US);
Inventors:
Assignee:
Micron Technology, Inc., Boise, ID (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01); G06F 3/06 (2006.01); G06F 11/07 (2006.01); G06F 11/10 (2006.01); G06F 11/14 (2006.01); G06F 11/30 (2006.01);
U.S. Cl.
CPC ...
G06F 11/1068 (2013.01); G06F 3/0619 (2013.01); G06F 3/0659 (2013.01); G06F 3/0679 (2013.01); G06F 11/076 (2013.01); G06F 11/0772 (2013.01); G06F 11/1471 (2013.01); G06F 11/3037 (2013.01);
Abstract
An error associated with a read operation corresponding to a memory die of a memory sub-system is detected. In response to detecting the error, a first read throughput level of the memory sub-system is identified. A quantity of queues receiving operation requests is decreased, the decreased quantity of queues corresponding to a second read throughput level. A read retry operation associated with the memory die is initiated at the second read throughput level.