The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 26, 2024

Filed:

Dec. 14, 2021
Applicant:

Micron Technology, Inc., Boise, ID (US);

Inventors:

Joseph Harold Steinmetz, Loomis, CA (US);

Luca Bert, San Jose, CA (US);

Assignee:

Micron Technology, Inc., Boise, ID (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 3/06 (2006.01);
U.S. Cl.
CPC ...
G06F 3/0619 (2013.01); G06F 3/0653 (2013.01); G06F 3/0673 (2013.01);
Abstract

A memory sub-system, such as a solid state drive (SSD), having host interface configured to receive at least read commands and write commands from an external host system. The SSD has memory cells formed on at least one integrated circuit die, and a processing device configured to control executions of the read commands to retrieve data from the memory cells and executions the write commands to store data into the memory cells. During an autonomous self-test operation of the memory sub-system, the memory sub-system is configured to generate random challenges of proof of space, generate using a proof of space plot, stored in the memory cells, responses to the random challenges respectively, and determine validity of the responses to evaluate health of the memory cells.


Find Patent Forward Citations

Steinmetz, Joseph. (2024). Test memory sub-systems through validation of responses to proof of space challenges (U.S. Patent No. 11941254). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11941254

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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