The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 26, 2024

Filed:

Oct. 15, 2021
Applicant:

Infineon Technologies Ag, Neubiberg, DE;

Inventors:

Thomas Aichinger, Faak am See, AT;

Maximilian Wolfgang Feil, Kirchseeon, DE;

Andre Kabakow, Großhelfendorf, DE;

Hans Reisinger, Gruenwald, DE;

Assignee:

Infineon Technologies AG, Neubiberg, DE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/311 (2006.01); G01R 31/00 (2006.01); H01L 25/16 (2023.01); H01L 25/18 (2023.01); H01L 27/144 (2006.01); H03K 17/687 (2006.01);
U.S. Cl.
CPC ...
G01R 31/311 (2013.01); G01R 31/00 (2013.01); H01L 25/167 (2013.01); H01L 25/18 (2013.01); H01L 27/1443 (2013.01); H03K 17/687 (2013.01);
Abstract

A semiconductor device includes: a semiconductor body; an electrical device formed in an active region of the semiconductor body, the active region including an interface between the semiconductor body and an insulating material; and a sensor having a bandwidth tuned to at least part of an energy spectrum of light emitted by carrier recombination at the interface when the electrical device is driven between accumulation and inversion, wherein an intensity of the emitted light is proportional to a density of charge trapping states at the interface, wherein the sensor is configured to output a signal that is proportional to the intensity of the sensed light. Corresponding methods of monitoring and characterizing the semiconductor device and a test apparatus are also described.


Find Patent Forward Citations

Loading…