The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 19, 2024

Filed:

Sep. 21, 2020
Applicant:

Taiwan Semiconductor Manufacturing Company, Ltd., Hsinchu, TW;

Inventors:

Chu Fu Chen, Zhubei, TW;

Chi-Feng Huang, Zhubei, TW;

Chia-Chung Chen, Keelung, TW;

Chin-Lung Chen, Zhubei, TW;

Victor Chiang Liang, Hsinchu, TW;

Chia-Cheng Pao, Hsinchu, TW;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H02M 3/158 (2006.01); H01L 21/84 (2006.01); H01L 29/08 (2006.01); H01L 29/423 (2006.01); H01L 29/66 (2006.01); H01L 29/78 (2006.01); H01L 29/80 (2006.01); H01L 21/265 (2006.01);
U.S. Cl.
CPC ...
H02M 3/1582 (2013.01); H01L 21/84 (2013.01); H01L 29/0847 (2013.01); H01L 29/4232 (2013.01); H01L 29/66659 (2013.01); H01L 29/7835 (2013.01); H01L 29/7836 (2013.01); H01L 29/80 (2013.01); H01L 21/26586 (2013.01); H02M 3/158 (2013.01);
Abstract

A transistor includes a gate structure over a substrate, wherein the substrate includes a channel region. The transistor further includes a source/drain (S/D) in the substrate adjacent to the gate structure. The transistor further includes a lightly doped drain (LDD) region adjacent to the S/D, wherein a dopant concentration in the first LDD is less than a dopant concentration in the S/D. The transistor further includes a doping extension region adjacent the LDD region, wherein the doping extension region extends farther under the gate structure than the LDD region, and a maximum depth of the doping extension region is 10-times to 30-times greater than a maximum depth of the LDD.


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