The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 19, 2024
Filed:
Dec. 27, 2022
Applicant:
Aionco, Inc., Menlo Park, CA (US);
Inventors:
Cheuk Ying Tang, Cupertino, CA (US);
Edmund Wong, Mountain View, CA (US);
Gene Lee, Millbrae, CA (US);
Assignee:
Mujin, Inc., Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G16B 20/20 (2019.01); G16B 40/20 (2019.01); G16B 50/00 (2019.01);
U.S. Cl.
CPC ...
G16B 40/20 (2019.02); G16B 20/20 (2019.02); G16B 50/00 (2019.02);
Abstract
Introduced here is an approach to further refining an initial set of target locations that can serve as inputs to machine learning mechanisms. These target locations may refer to unique molecular positions in a reference human genome and/or mutations thereof that are diagnostically relevant for a given cancer type. The system can implement a refinement mechanism to account for unnecessary or problematic data, such as consecutive/overlapping patterns, non-uniform read counts, insufficient data quality, internal processing noises, and/or insufficient data counts.