Dynamic adjustment of wordline timing in static random access memory

Abstract

A static random access memory (SRAM) has one or more arrays of memory cells, each array of memory cells activated in columns by a wordline. The activated column of memory cells asserts output data onto a plurality of bitlines coupled to output drivers. The SRAM includes a wordline controller generating a variable wordline signal pulse width which may be reduced sufficiently to introduce memory read errors. Each of a high error rate, medium error rate, low error rate, and a nearly error-free rate is associated with a pulse width value generated by the wordline controller. A power consumption tradeoff exists between the wordline signal pulse width and consumed SRAM power. The wordline controller is thereby able to associate a wordline signal pulse width with an associated error rate for performing tasks which are insensitive to a high error rate or a medium error rate, which are specific to certain neural network training and inference using various NN data types.