The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 19, 2024
Filed:
May. 17, 2022
Changxin Memory Technologies, Inc., Hefei, CN;
Dong Liu, Hefei, CN;
CHANGXIN MEMORY TECHNOLOGIES, INC., Hefei, CN;
Abstract
The present disclosure provides a method and an apparatus for testing a memory chip, and a storage medium, and belongs to the technical field of semiconductors. The method for testing a memory chip includes: writing test data into a memory cell of a to-be-tested memory chip; reading stored data from the memory cell; and generating a test result of the to-be-tested memory chip based on the test data and the stored data; wherein in the reading stored data from the memory cell, a row address strobe precharge time is less than a standard row address strobe precharge time of the to-be-tested memory chip, and/or a current sensing delay time of the to-be-tested memory chip is less than a standard sensing delay time of the to-be-tested memory chip.