The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 19, 2024
Filed:
May. 27, 2022
Applicant:
Micron Technology, Inc., Boise, ID (US);
Inventors:
Larry J. Koudele, Erie, CO (US);
Bruce A. Liikanen, Berthoud, CO (US);
Assignee:
Micron Technology, Inc., Boise, ID (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 3/06 (2006.01); G11C 11/56 (2006.01); G11C 16/34 (2006.01); G11C 29/02 (2006.01);
U.S. Cl.
CPC ...
G06F 3/0619 (2013.01); G06F 3/061 (2013.01); G06F 3/065 (2013.01); G06F 3/0688 (2013.01); G11C 11/5628 (2013.01); G11C 16/3459 (2013.01); G11C 16/3495 (2013.01); G11C 29/021 (2013.01); G11C 29/028 (2013.01); G11C 2207/2254 (2013.01); G11C 2211/5621 (2013.01);
Abstract
A memory system includes a memory array including a plurality of memory cells; and a controller coupled to the memory array, the controller configured to: determine a target profile including distribution targets, wherein each of the distribution targets represent a program-verify target corresponding to a logic value for the memory cells, determine a feedback measure based on implementing a processing level for processing data, and dynamically adjust the program-verify target according to the feedback measure.