The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 19, 2024
Filed:
Oct. 09, 2019
Applied Materials, Inc., Santa Clara, CA (US);
Shih-Hsien Lee, Hsinchu, TW;
Tingwei Chiu, Taichung, TW;
Frederick Lie, Dacun, TW;
Jang Fung Chen, Cupertino, CA (US);
APPLIED MATERIALS, INC., Santa Clara, CA (US);
Abstract
Embodiments described herein relate to methods of forming layers using maskless based lithography. In these embodiments, the methods implement ladders of dose change such that a geometric shape can be divided into overlaying sections. The overlaying sections can include a different dose of each section such that taper control can be achieved. The taper can be achieved by manipulating the geometry 'mask data' into overlaying sections that are exposed by various doses controlled by pixel blending (PB) exposure techniques. To perform the methods described herein, a maskless lithography tool is used. The maskless lithography tool includes a controller that performs software based “mask data” manipulation. As such, because the methods are performed by software with no mask, there is much more flexibility to tune the taper angles and/or photoresist thickness residuals for multi-tone/gray tone mask features without any additional mask cost and fabrication time, providing advantages over conventional lithography methods using masks.