The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 19, 2024

Filed:

Dec. 03, 2020
Applicant:

Carl Zeiss Microscopy Gmbh, Jena, DE;

Inventors:

Jörg Siebenmorgen, Jena, DE;

Ralf Netz, Jena, DE;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G02B 21/08 (2006.01); G02B 21/16 (2006.01); G02B 27/42 (2006.01);
U.S. Cl.
CPC ...
G02B 21/08 (2013.01); G02B 21/16 (2013.01); G02B 27/425 (2013.01); G02B 27/4294 (2013.01);
Abstract

An illumination apparatus for illuminating a sample plane and a sample that is optionally arranged therein along an illumination beam path includes: a first light source (for outputting light of at least one first wavelength (λ), a second light source for outputting light of at least one second wavelength (λ), and a diffraction grating in the illumination beam path between the first and second light sources and the sample plane. Light of the first wavelength (λ) is not diffracted by the diffraction grating, and light of the second wavelength (λ) is diffracted due to the effect of the diffraction grating. The illumination apparatus can be used in a microscope.


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