The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 19, 2024
Filed:
Mar. 27, 2020
Applicant:
Nidec Read Corporation, Kyoto, JP;
Inventors:
Minoru Kato, Kyoto, JP;
Makoto Fujino, Kyoto, JP;
Assignee:
NIDEC READ CORPORATION, Kyoto, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/00 (2006.01); G01R 1/02 (2006.01); G01R 1/04 (2006.01); G01R 1/067 (2006.01); G01R 1/073 (2006.01); G01R 31/28 (2006.01); G01R 31/26 (2020.01);
U.S. Cl.
CPC ...
G01R 31/2808 (2013.01); G01R 1/06722 (2013.01); G01R 1/073 (2013.01); G01R 31/2601 (2013.01);
Abstract
In various examples, an inspection jig includes a plate-shaped insulating member having a recess; a first board having a first electrode; and a conducting wire electrically connected to a contact terminal. The insulating member is provided with a through hole penetrating a bottom portion of the recess. One end portion of the conducting wire is disposed in the through hole. The other end of the conducting wire is connected to the first electrode.
Kato, Minoru. (2024). Inspection jig, and inspection device (U.S. Patent No. 11933837). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11933837
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile