The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 12, 2024
Filed:
Aug. 30, 2021
Amazon Technologies, Inc., Seattle, WA (US);
Ruhi Sarikaya, Redmond, WA (US);
Zheng Du, Bellevue, WA (US);
Xiaohu Liu, Bellevue, WA (US);
Kai Liu, Redmond, WA (US);
Sriharsha Venkata Chintalapati, Hyderabad, IN;
Chenlei Guo, Redmond, WA (US);
Hung Tuan Pham, Kirkland, WA (US);
Joe Pemberton, Seattle, WA (US);
Zhenyu Yao, Sammamish, WA (US);
Bigyan Rajbhandari, Kirkland, WA (US);
Amazon Technologies, Inc., Seattle, WA (US);
Abstract
Techniques for performing centralized unsuperivised learning in a multi-domain system are described. A user may request labeled data for an ML task, where the request includes a prompt for obtaining relevant explicit user feedback. The system may use the prompt to collect explicit user feedback for relevant runtime user inputs. After a duration of time (in the user's request for labeled data) has elapsed, the system determines whether collected user feedback indicates processing of the user input was defective and, if so, determines a cause of the defective processing. The system then uses one or more label generators to generate labeled data using the collected user feedback, whether the processing was defective, and the determined defect cause.