The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 12, 2024

Filed:

May. 17, 2021
Applicant:

Anritsu Corporation, Kanagawa, JP;

Inventors:

Hideyuki Endo, Kanagawa, JP;

Hironori Watanabe, Kanagawa, JP;

Takumi Nakamura, Kanagawa, JP;

Yui Yoshida, Kanagawa, JP;

Assignee:

ANRITSU CORPORATION, Kanagawa, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 29/08 (2006.01); G01R 29/10 (2006.01); H04B 17/00 (2015.01);
U.S. Cl.
CPC ...
G01R 29/0821 (2013.01); G01R 29/105 (2013.01); H04B 17/0085 (2013.01); H04B 17/0087 (2013.01);
Abstract

A measuring deviceincludes a DUT scanning mechanismthat is provided in the OTA chamber, includes a biaxial positioner which can be rotationally driven by drive motorsand, and rotates a DUTto sequentially face all preset directions of a spherical coordinate system; an integrated control devicethat measures the DUTat each measurement position corresponding to each of the all directions; and a rotation speed management control unitthat controls a rotation speed of the drive motorsandat a rotation speed which shortens a time required for the movement in a case where the biaxial positioner is moved at a unit step angle from a measurement position where the measurement is completed to a measurement position where next measurement is performed during the DUTis measured.


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