The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 12, 2024
Filed:
Dec. 28, 2022
Applicant:
Nova Ltd., Rehovot, IL;
Inventors:
Gilad Barak, Rehovot, IL;
Yonatan Oren, Kiryat Ono, IL;
Assignee:
NOVA LTD., Rehovot, IL;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01J 3/44 (2006.01); G01J 3/02 (2006.01); G01J 3/06 (2006.01); G01J 3/10 (2006.01); G01J 3/28 (2006.01);
U.S. Cl.
CPC ...
G01J 3/0208 (2013.01); G01J 3/0224 (2013.01); G01J 3/06 (2013.01); G01J 3/10 (2013.01); G01J 3/2803 (2013.01); G01J 3/2823 (2013.01); G01J 3/44 (2013.01); G01J 2003/283 (2013.01);
Abstract
A polarized Raman Spectrometric system for defining parameters of a polycrystalline material, said system comprising: a polarized Raman Spectrometric apparatus, a computer-controlled sample stage for positioning a sample at different locations, and a computer comprising a processor and an associated memory.
Barak, Gilad. (2024). Optical technique for material characterization (U.S. Patent No. 11927481). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11927481
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile