The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 05, 2024

Filed:

Sep. 01, 2021
Applicant:

Intel Corporation, Santa Clara, CA (US);

Inventors:

Dario Sabella, Munich, DE;

Kilian Peter Anton Roth, Munich, DE;

Assignee:

Intel Corporation, Santa Clara, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04W 4/24 (2018.01); H04L 12/14 (2006.01); H04L 47/10 (2022.01); H04L 47/70 (2022.01); H04M 15/00 (2006.01); H04W 92/18 (2009.01); H04L 65/80 (2022.01);
U.S. Cl.
CPC ...
H04L 47/18 (2013.01); H04L 12/1407 (2013.01); H04L 47/822 (2013.01); H04L 47/824 (2013.01); H04M 15/66 (2013.01); H04M 15/8033 (2013.01); H04M 15/8044 (2013.01); H04M 15/8083 (2013.01); H04M 15/93 (2013.01); H04W 4/24 (2013.01); H04W 92/18 (2013.01); H04L 65/80 (2013.01);
Abstract

Embodiments herein may include systems, apparatuses, methods, and computer-readable media, for a multi-access edge computing (MEC) system. An apparatus for MEC may include a communication interface, a local cost measurements module, and a service allocation module. The communication interface may receive, from a UE, a request for a service to be provided to the UE. The local cost measurements module may collect a set of local cost measurements for the service. The service allocation module may determine to allocate the service to a MEC host based on an allocation policy related to a cost for the MEC host to provide the service or a cost for a service provider to provide the service in view of the one or more local cost measurements. Other embodiments may be described and/or claimed.


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