The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 05, 2024

Filed:

Oct. 13, 2021
Applicant:

Teradyne, Inc., North Reading, MA (US);

Inventor:

Padmanabha Kannampalli, North Reading, MA (US);

Assignee:

Teradyne, Inc., North Reading, MA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/26 (2006.01); G06F 11/22 (2006.01); G06N 20/00 (2019.01); G06F 11/263 (2006.01);
U.S. Cl.
CPC ...
G06F 11/2263 (2013.01); G06F 11/2268 (2013.01); G06F 11/26 (2013.01); G06N 20/00 (2019.01); G06F 11/2635 (2013.01);
Abstract

Example techniques may be implemented as a method, a system or more non-transitory machine-readable media storing instructions that are executable by one or more processing devices, Operations performed by the example techniques include obtaining data representing results of tests executed by one or more test instruments on an initial set of devices under test (DUTs) in a test system; and using the data to train a machine learning model. The machine learning model is for predicting which of the tests will produce failing results for a different set of DUTs. DUTs in the different set have one or more features in common with DUTs in the initial set.


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